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Analytical Techniques

Analytical Techniques - Surface Analysis

Rapid solving of surface-related problems with chemical composition and physical structure characterization delivered by experts using the latest techniques.

  • XPS (X-ray Photoelectron Spectroscopy)
    Quantitative elemental, chemical state and functional group information from the surface of materials, detecting all elements except H and He in the concentration range from 100 at.% to ~0.1 at.%.
  • WLI (White Light Interferometry)
    Topographical information from the surface including 2D, 3D images and profilometry as well as roughness parameters including surface roughness, peak height and valley depth.
  • AFM (Atomic Force Microscopy)
    An advanced form of stylus profilometry where an extremely sharp inert tip is scanned over a surface to produce topographical images.
  • TEM (Transmission Electron Microscopy) - nano-scale compositional and structural information with images.
  • Raman Spectroscopy - a non-contact method providing information on chemical bonds and molecular structure.