Powder XRD provides detailed information on the crystallographic structure and physical properties of materials and thin films.

The sample is irradiated with a beam of monochromatic x-rays over a variable incident angle range.  Interaction with atoms in the sample results in diffracted x-rays when the Bragg equation is satisfied.  Resulting spectra are characteristic of chemical composition and phase.  The technique uniquely provides phase identification (e.g. graphite or diamond), along with phase quantification, % crystallinity, crystallite size and unit cell size.  For layered materials, Grazing Incidence XRD (GIXRD) allows compositional depth profiling of phases within the structure.

• Non-destructive analysis with identification of phase e.g. quartz / cristobalite / tridymite for silica
• Phase quantification, % crystallinity and measurement of crystallite and unit cell size
• Definition of bulk crystal structure including defects and solid solution, using Rietveld Structure Refinement
• Depth profiling of compositional and phase changes within layered materials by Grazing Incidence XRD
• Measurement of layer thickness on the nm scale for highly polished materials using X-Ray Reflectivity (XRR)
• Small area analysis and phase mapping by Micro X-Ray Diffraction (µXRD).

Typical Applications

• Phase composition determination
• Characterization of doped cell structures for electroceramics
• Measurement of hard coating composition and structure e.g. carbides, nitrides on machine tools
• Characterization of hydroxyapatite coatings on medical implant materials
• In-depth analysis of silicon wafers, ITO coated glasses and solar cells.

Typical Industries using XRD

• Aerospace
• Automotive
• Materials
• Minerals
• Glass, Ceramics and Refractories
• Healthcare
• Medical Devices
• Semiconductors
• Electronics.

Associated Test Methods

• Respirable Crystalline Silica by XRD - MDHS 101:2005
• XRD Analysis of Hydroxyapatite for Medical Applications -
  ISO 13779-3 (2008)

Further Information on XRD Techniques

• Rietveld Refinement
• Micro X-Ray Diffraction (µXRD)
• Grazing Incidence of Diffraction (GID)