Chemical Imaging of Industrial and Healthcare Materials by ToFSIMS
Chemical imaging is a powerful tool that can be applied to a wide variety of applications. Time-of-Flight Secondary Ion Mass Spectrometry (ToFSIMS) is an advanced technique that provides information about the chemistry of the surface of samples and allows analysts to also spatially map the chemistry of the surface.
To obtain a more in-depth profile of analytes, ToFSIMS is often used in conjunction with other surface analysis techniques but, as a standalone technique, it still offers valuable insight into the surfaces of materials.
This white paper discusses the power of ToFSIMS across a range of different industries and materials and the specific information and value provided.
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