Lucideon has created a new 3D Microscopy facility which combines Optical, Confocal and Scanning Electron Microscopy techniques. This provides a unique capability for 3D Imaging and surface metrology, allowing visualisation and quantitative measurement of features on the nanometre scale to centimetres and beyond.
The depth of knowledge of our experts across the whole range of manufacturing and research sectors coupled with a rapid response culture produces major benefits to clients with solutions delivered within 24 hours if required.
The techniques which comprise the facility are based on White Light Interferometry, Confocal Microscopy, 3D Scanning Electron Microscopy and Structured Light 3D Interferometry. These typically provide: