Polymer Surface Examination
We use high powered techniques to study the surface of your products and materials. The surface of your materials will define how they interact with substrates and their surrounding environment. Surface analysis can give vital insights about how your product will perform in certain environments. Post exposure or contact testing will allow you to understand the behavior of your product's surface.
Our surface analysis techniques include:
- X-ray Photoelectron Spectroscopy (XPS) – enables quantitative elemental analysis on the surface of polymers with around 0.1% sensitivity.
- Dynamic Secondary Ion Mass Spectrometry (DSIMS) – detects the change of surface properties and characterises surface coatings, treatments, contamination, adhesion and printability of polymer materials by means of quantitative analysis of elemental composition (sensitivity up to ppm). DSIMS provides chemical imaging and depth profiling from the surface to depths of 100 microns and beyond.
- Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) – provides elemental and molecular information in spectral or imaging mode and maps the entire surface across a face or cross-section of polymer samples with a sensitivity of ppm to ppb level.
- White Light Interferometry (WLI) – 3DP (3D Non-Contact Profiling) – provides quantitative topographical information from the surface of polymer samples including 2D/3D images and roughness parameters including surface roughness, peak height and valley depth (lateral resolution <1µm; height resolution <1nm).