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Analytical Techniques - Surface Analysis

Rapid solving of surface-related problems with chemical composition and physical structure characterization delivered by experts using the latest techniques.

XPS (X-ray Photoelectron Spectroscopy) 
Quantitative elemental, chemical state and functional group information from the surface of materials, detecting all elements except H and He in the concentration range from 100 at.% to ~0.1 at.%.

Dynamic SIMS (Secondary Ion Mass Spectrometry) 
Elemental composition of materials from the surface to depths of 100 microns and beyond.

ToF-SIMS (Time-of-Flight Secondary Ion Mass Spectrometry) 
Elemental and molecular information in spectral or imaging mode with low detection limits and sampling depth of 1-3nm.

WLI (White Light Interferometry) 
Topographical information from the surface including 2D, 3D images and profilometry as well as roughness parameters including surface roughness, peak height and valley depth.

SEM/EDX (Scanning Electron Microscopy / Energy Dispersive Analysis) 
Microstructural analysis, fault diagnosis, imaging and elemental analysis of small areas of solid materials.

3DSEM (Three Dimensional Scanning Electron Microscopy) 
Combines the high resolution imaging of SEM with quantitative surface metrology information.

XRD (X-Ray Diffraction) 
Mineralogical analysis of solid materials for phase determination.

FTIR (Fourier Transform Infrared Analysis) 
Identification of compounds and chemical functionality in the near-surface region of materials.

AFM (Atomic Force Microscopy) 
An advanced form of stylus profilometry where an extremely sharp inert tip is scanned over a surface to produce topographical images.

TEM (Transmission Electron Microscopy) - nano-scale compositional and structural information with images.

Raman Spectroscopy - a non-contact method providing information on chemical bonds and molecular structure.