FEG-SEM Analysis (Field Emission Gun Scanning Electron Microscopy)

Field Emission Gun Scanning Electron Microscopy (FEG-SEM) analysis is a powerful technique used to capture ultra-high-resolution images of material surfaces at the nanoscale. FEG-SEM delivers detailed microstructural and topographical information, supported by integrated Energy Dispersive Analysis (EDS) and Electron Backscatter Diffraction (EBSD) for precise chemical compositional verification and crystallographic analysis. FEG-SEM is essential for failure investigations, contamination studies, porosity evaluation, and advanced material development. Combined with our UKAS-accredited testing and expert consultancy, Lucideon's FEG-SEM services help you understand material behaviour, optimise performance, and solve complex engineering challenges.

At Lucideon, our FEG-SEM service offers ultra-high-resolution imaging and precise chemical and structural analysis, providing insight into a materials microstructure. Whether you are investigating a product failure or developing high-performance materials, our expert-led capabilities offer the depth of insight you need, backed by expert consultancy to interpret the findings in context.

Advanced capability with the Hitachi SU7000

Our Hitachi SU7000 FEG-SEM is designed to deliver ultra-clear imaging and advanced analytical performance. Its key capabilities include:

• Magnification ranges from X20 to 2,000,000 - enabling detailed imaging at the nanoscale
• Exceptional resolution - 0.8 nm @ 15 kV, 0.9 nm @ 1 kV
• Large sample compatibility - Accepts specimens up to 200 mm in diameter and 80 mm in height
• EDS and EBSD integration - for elemental and crystallographic analysis
• 3D surface mapping - providing valuable topographical information

These features make the SU7000 ideal for imaging and analysing everything from dense metals and advanced ceramics to delicate polymers and coatings.

Applications

FEG-SEM is widely used for:

• Failure analysis - microfracture, delamination, surface degradation
• Coating and surface characterization - layer thickness, bonding, uniformity
• Contamination and inclusion analysis - identification of foreign materials
• Porosity and grain structure analysis - for ceramics, metals, and sintered components
• Chemical compositional verification - confirm material consistency or investigate anomalies

Consultancy-led approach

At Lucideon, we go beyond simply supplying images and data. Our materials scientists and technical consultants interpret your FEG-SEM results within the broader context of your application, product performance, and manufacturing process. We provide clear recommendations alongside your results to support confident, informed decision-making.

Integrated characterization services

FEG-SEM analysis is often combined with other microstructural techniques to form a complete materials profile:

• XRD (X-ray diffraction) - for phase identification and crystallinity
• Hot stage XRD - for observing thermal changes to microstructure in real time
• Differential thermal analysis & spectroscopy - to complement microstructural findings with thermal or molecular data

Lucideon's broad range of capabilities allows us to build integrated test plans tailored to your materials challenges.