The combination of state-of-the-art instrumentation and expert analysts at Lucideon guarantees optimum problem solving capability using these techniques:

• XRF (X-Ray Fluorescence Spectrometry)
  Major, minor and trace bulk elemental analysis of inorganic materials.

• Trace Elemental Analysis (ICP-MS & ICP-OES)
  ICP-MS: trace analysis of elements to identify individual masses and isotopic fingerprints, with detection limits at or below parts per trillion (ppt). ICP-OES: trace analysis of inorganic materials, down to parts per million (ppm) or less.

• IC (Ion Chromatography)
  Analysis of liquids / solutions for anions such as halides and sulphates.

• GC (Gas Chromatography)
  Major organic compound analysis as gases or volatile components.

• GC-MS (Gas Chromatography-Mass Spectrometry)
  Trace organic compound analysis as gases or volatile components.

• EPMA (Electron Probe Microanalysis)
  Fully quantitative elemental weight percent with micron spatial resolution, secondary & backscattered electron images.

• FTIR - Fourier Transform Infrared Analysis
  Provides detailed information on the bond structures within compounds.

• SEM/EDX (Scanning Electron Microscopy/Energy Dispersive Analysis)
  Microstructural analysis, fault diagnosis, imaging and elemental analysis of small areas of solid materials.

• XRD (X-Ray Diffraction)
  Mineralogical analysis of solid materials for phase determination.

• GPC (Gel Permeability Chromatography)
  Measurement of molecular weight distribution.

• NMR (Nuclear Magnetic Resonance)
  Physical, chemical, electronic and structural information from organic liquids and solids.