• Contact us
  • UK +44 (0)1782 764428
  • US 919-504-4900

You are here: Home » Insight hub » News Releases » Ceram Invests in State-of-the-Art Fourier Transform Infrared (FTIR) System

Ceram Invests in State-of-the-Art Fourier Transform Infrared (FTIR) System

Ceram has recently invested in a state-of-the art Fourier Transform Infrared (FTIR) system which provides identification of compounds and chemical functionality in the near-surface region of materials.

Part of Ceram's extensive analytical suite, the new system will also form a critical part of their problem-solving capability, which includes SEM, DSIMS, ToF-SIMS, XPS and 3DP, that they offer to customers.

FTIR provides detailed information on the bond structures within compounds and has numerous applications, from identification of solid or liquid organic and inorganic compounds and identification of polymers, polymer blends, rubbers, adhesives and coatings to mapping of coating thicknesses and examination of microstructures. This will allow Ceram to offer clients, amongst other things, confirmation of consistency of raw and finished manufacturing materials, surface modification and sample weathering studies, analysis of unknown solvents and detergents and identification of manufacturing impurities and defects.

Richard White, Head of Testing at Ceram, comments:
"We are committed to solving the many material challenges that our customers in industries as diverse as healthcare, petrochemicals, defence and construction face. To do this, we ensure that we have the latest analytical equipment available so that we can offer a speedy, accurate and comprehensive service. This is all backed up, of course, by our team of renowned materials scientists and consultants who work closely with our customers to help them make their materials/products/processes better, keeping them ahead of the competition and maximising their profit."

Ceram's investment in resources can also be seen by the purchase of a new XRD (X-Ray Diffractometer) which provides detailed information on the crystallographic structure and physical properties of materials and thin films including, thanks to its Grazing Incidence capabilities, compositional depth profiling of phases within the structure of layered materials.

07 December, 2010

Contact Us

Get in touch