Surface Imaging & Analysis
The surface of a material is a crucial part of its makeup, giving it functionality, performance properties, texture and aesthetics. Lucideon's surface science team provides quantitative and qualitative surface analysis, producing scientific conclusions and support that’s both visual and backed by detailed data and analysis – helping you to improve existing and develop new dental materials and products.
Elemental and molecular imaging can be used to map across an outer surface or cross section of a material or device.
Surfaces can be analyzed to identify the presence of dopants, process contaminants, impurities and surface treatments to depths of tens of microns. Depth analysis allows characterization of layer structures, buried features and surface treatments. Multi-Element depth profiling can be performed to depths from nm to tens of µm. Non-destructive testing can be performed so samples don’t have to be sacrificed.
Surface analysis techniques are compatible with retrospective 3D mapping techniques to show chemical maps and depth profiles. Chemical mapping can show features down to <1 micron in size, a useful technique for the clear diagnosis of fault areas, among other applications. Surface Topography is used to generate 3D maps on nm scale showing microstructure, wear, etc. and can also be applied to cross sectional materials to give extended information through a structure, which is particularly useful for complex, thick layered materials.
Our experts are actively involved in a number of research programmes and EU projects, as well as one-off analyses, which include:
- Troubleshooting problems
- Defending product claims
- Settling commercial liability disputes
- Reverse engineering of competitor products
- Validating new products and processes.
- XPS (X-ray Photoelectron Spectroscopy)
- Dynamic SIMS (Secondary Ion Mass Spectrometry)
- ToF-SIMS (Time-of-Flight Secondary Ion Mass Spectrometry)
- WLI (White Light Interferometry)
- SEM/EDX (Scanning Electron Microscopy/Energy Dispersive Analysis)
- 3DSEM (Three Dimensional Scanning Electron Microscopy)
- XRD (X-Ray Diffraction)
- FTIR (Fourier Transform Infrared Analysis)
- AFM (Atomic Force Microscopy)
- TEM (Transmission Electron Microscopy)
- Raman Spectroscopy.