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Surface Analysis & Problem Solving for the Space Industry

Even the largest problems may come down to something as small as a trace element or nanoscale feature.  Lucideon's world-leading surface analysis capabilities and industry experience allow us to approach problem solving from many angles to ensure that your issue is resolved on a timeline that meets your needs.

We specialize in surface, near surface and interface analysis, using a wide range of techniques to:

  • Solve failures (contamination, adhesion, wear, lubrication)
  • Optimize new product development
  • Support quality control systems
  • Validate new products and processes
  • Support product claims.

Direct surface analysis reveals exactly what is on the sample surface, what it looks like, where it is, and how any residual compounds / surface treatments interact with or affect other properties of the base material (chemically & physically).

Let our team be an extension of your internal capabilities in order to provide solutions.  

Here are just a few areas where our surface science team can provide answers to your questions:

  • Coating characterization - uniformity, dispersion of API, composition, roughness
  • 3D imaging of surface
  • Surface finish, defect analysis, wear patterns
  • Surface characterization - assessing the effect of treatments such as acids, lubricants, and wear
  • Depth profiling - understanding the penetration of a chemical or treatment into a material
  • Interface analysis - adhesion / interaction of a coating or laminate, and possible cause of failure
  • Identifying and mapping of trace elements - identification and distribution of contaminant, corrosion products
  • Porosity / void identification - possible cause of leakages in a material, or fracture initiation points
  • Validation of cleaning processes - identification and quantification of detergents, lubricants and trace elements.

Surface Analysis Techniques

  • XPS (X-ray Photoelectron Spectroscopy)
  • Dynamic SIMS (Secondary Ion Mass Spectrometry)
  • ToF-SIMS (Time-of-Flight Secondary Ion Mass Spectrometry)
  • WLI (White Light Interferometry)
  • SEM/EDX (Scanning Electron Microscopy/Energy Dispersive Analysis)
  • 3DSEM (Three Dimensional Scanning Electron Microscopy)
  • XRD (X-Ray Diffraction)
  • FTIR (Fourier Transform Infrared Analysis)
  • AFM (Atomic Force Microscopy)
  • TEM (Transmission Electron Microscopy)
  • Raman Spectroscopy.

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Resources

  • White Paper

    How Surface Characterization is Helping the Aerospace Industry to Achieve Environmental Targets
    pdf (705 KB)

  • White Paper

    Surface Engineering Coating Technology and Characterization of the Surface Region
    pdf (657 KB)

  • Data Sheet

    • Space Services Portfolio

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  • Aerospace & Defense Newsletter

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