Surface Analysis & Problem Solving for the Defense Industry
Very few industries operate in the extreme conditions and environments that the defense industry typically operates in. Understanding the surface can be paramount to operational reliability. Whether during the development stages of a product or during a failure investigation, our world-leading surface analysis capabilities and industry experience allow us to bring resolutions to your challenges on a timeline that meets your needs.
We specialize in surface, near surface and interface analysis, using a wide range of techniques to:
- Solve failures (contamination, adhesion, wear, lubrication)
- Optimize new product development
- Support quality control systems
- Validate new products and processes
- Support product claims.
Direct surface analysis reveals exactly what is on the sample surface, what it looks like, where it is, and how any residual compounds / surface treatments interact with or affect other properties of the base material (chemically and physically).
Let our team be an extension of your internal capabilities in order to provide solutions. Here are just a few areas where our surface science team can provide answers to your questions:
- Coating characterization - uniformity, dispersion of API, composition, roughness
- 3D imaging of surface
- Surface finish, defect analysis, wear patterns
- Surface characterization - assessing the effect of treatments such as acids, lubricants, and wear
- Depth profiling - understanding the penetration of a chemical or treatment into a material
- Interface analysis - adhesion / interaction of a coating or laminate, and possible cause of failure
- Identifying and mapping of trace elements - identification and distribution of contaminant, corrosion products
- Porosity / void identification - possible cause of leakages in a material, or fracture initiation points
- Validation of cleaning processes - identification and quantification of detergents, lubricants and trace elements.
Surface Analysis Techniques
- XPS (X-ray Photoelectron Spectroscopy)
- Dynamic SIMS (Secondary Ion Mass Spectrometry)
- ToF-SIMS (Time-of-Flight Secondary Ion Mass Spectrometry)
- WLI (White Light Interferometry)
- SEM/EDX (Scanning Electron Microscopy/Energy Dispersive Analysis)
- 3DSEM (Three Dimensional Scanning Electron Microscopy)
- XRD (X-Ray Diffraction)
- FTIR (Fourier Transform Infrared Analysis)
- AFM (Atomic Force Microscopy)
- TEM (Transmission Electron Microscopy)
- Raman Spectroscopy.