Analytical Techniques - Surface Analysis
Rapid solving of surface-related problems with chemical composition and physical structure characterization delivered by experts using the latest techniques.
XPS (X-ray Photoelectron Spectroscopy) - quantitative elemental, chemical state and functional group information from the surface of materials, detecting all elements except H and He in the concentration range from 100 at.% to ~0.1 at.%.
Dynamic SIMS (Secondary Ion Mass Spectrometry) - elemental composition of materials from the surface to depths of 100 microns and beyond.
ToF-SIMS (Time-of-Flight Secondary Ion Mass Spectrometry) - elemental and molecular information in spectral or imaging mode with low detection limits and sampling depth of 1-3nm.
WLI (White Light Interferometry) - topographical information from the surface including 2D, 3D images and profilometry as well as roughness parameters including surface roughness, peak height and valley depth.
SEM/EDX (Scanning Electron Microscopy/Energy Dispersive Analysis) - microstructural analysis, fault diagnosis, imaging and elemental analysis of small areas of solid materials.
3DSEM (Three Dimensional Scanning Electron Microscopy) - combines the high resolution imaging of SEM with quantitative surface metrology information.
XRD (X-Ray Diffraction) - mineralogical analysis of solid materials for phase determination.
FTIR (Fourier Transform Infrared Analysis) - identification of compounds and chemical functionality in the near-surface region of materials.
AFM (Atomic Force Microscopy) - an advanced form of stylus profilometry where an extremely sharp inert tip is scanned over a surface to produce topographical images.
TEM (Transmission Electron Microscopy) - nano-scale compositional and structural information with images.
Raman Spectroscopy - a non-contact method providing information on chemical bonds and molecular structure.