Rapid solving of surface-related problems with chemical composition and physical structure characterization delivered by experts using the latest techniques.

• XPS (X-ray Photoelectron Spectroscopy)
  Quantitative elemental, chemical state and functional group information from the surface of materials, detecting all elements except H and He in the concentration range from 100 at.% to ~0.1 at.%.

• Dynamic SIMS (Secondary Ion Mass Spectrometry)
  Elemental composition of materials from the surface to depths of 100 microns and beyond.

• ToF-SIMS (Time-of-Flight Secondary Ion Mass Spectrometry)
  Elemental and molecular information in spectral or imaging mode with low detection limits and sampling depth of 1-3nm.

• WLI (White Light Interferometry)
  Topographical information from the surface including 2D, 3D images and profilometry as well as roughness parameters including surface roughness, peak height and valley depth.

• SEM/EDX (Scanning Electron Microscopy / Energy Dispersive Analysis)
  Microstructural analysis, fault diagnosis, imaging and elemental analysis of small areas of solid materials.

• 3DSEM (Three Dimensional Scanning Electron Microscopy)
  Combines the high resolution imaging of SEM with quantitative surface metrology information.

• XRD (X-Ray Diffraction)
  Mineralogical analysis of solid materials for phase determination.

• FTIR (Fourier Transform Infrared Analysis)
  Identification of compounds and chemical functionality in the near-surface region of materials.

• AFM (Atomic Force Microscopy)
  An advanced form of stylus profilometry where an extremely sharp inert tip is scanned over a surface to produce topographical images.

• TEM (Transmission Electron Microscopy) - nano-scale compositional and structural information with images.

• Raman Spectroscopy - a non-contact method providing information on chemical bonds and molecular structure.